How can one sample reveal more when examined from multiple perspectives? Combining SEM, TEM/STEM, 4D-STEM, spectroscopy, nanoindentation, nanoCT, CryoSEM or other analytical techniques can provide complementary information. Bringing these approaches together places demand on sample positioning, access and manipulation.
This webinar explores the role of precision sample manipulation as a key element for multimodal nanoscale characterization. We will look at how flexible, multi-axis positioning can support sample alignment, different measurement geometries and transitions between imaging, spectroscopy, diffraction, probing and other analytical methods.
Using SmarAct’s customizable SEM platform and related positioning solutions as examples, we will discuss practical approaches to integrating precise sample motion into advanced microscopy and characterization workflows, including applications in SEM, STEM, TEM, spectroscopy, tomography and in-situ experimentation.
The focus is not on one technique, but on the sample manipulation. How precise, adaptable manipulation systems can help to investigate the same specimen across complementary measurements and extract a more complete picture of its structure and properties.
Alexandra Glück is a physicist turned technical sales engineer. She studied in Freiburg and Berlin and has worked at German Aerospace Center (DLR), where she completed her doctorate in experimental physics. At SmarAct, she is in contact with researchers and companies active in materials science and related fields, and enjoys having technical discussions about the developments at the frontier of science and technology.
The post One sample, many dimensions: prospects for multimodal nanoscale characterization appeared first on Physics World.